Dual Beam Focused Ion Beam/Scanning Electron Microscope (DB-FIB) – Failure Analysis
Guide Important equipment for microanalysis techniques include: Optical Microscope (OM), Dual Beam Scanning Electron Microscope (DB-FIB), Scanning Electron Microscope (SEM), and Transmission Electron Microscope (TEM).… Read More »Dual Beam Focused Ion Beam/Scanning Electron Microscope (DB-FIB) – Failure Analysis