1. Why spray gold for non-conductive or poorly conductive samples? Answer: SEM imaging is to obtain the signals of secondary electrons and backscattered electrons through… Read More »Scanning Electron Microscopy (SEM) Frequently Asked Questions and Answers
Human wisdom promotes the continuous development of science and technology, thus starting our infinite exploration of the existing space. From the cosmic sky to the… Read More »Scanning Electron Microscope (SEM) leads material scientists to explore the microcosm!
In the field of materials, scanning electron microscopy plays an extremely important role and is widely used in the research of the morphology and structure… Read More »Easy to understand Scanning Electron Microscope (SEM)
Limited by the physical properties of light, the maximum resolution that an optical microscope can achieve is around 200 nm (Abbe limit). In the 1920s… Read More »Introduction of Vacuum System for Electron Microscope
Field Emission Transmission Electron Microscope (abbreviated as TEM), referred to as TEM, is an electron optical instrument with high resolution and high magnification, which uses… Read More »Application of Field Emission Transmission Electron Microscopy (TEM) in Battery Characterization
Electron gun type high brightness Schottky field emission electron gun Resolution 1 nm @ 15 kV 1.5nm @ 1kV Magnification 1 ~ 1000000 x Acceleration… Read More »High-resolution, feature-rich field emission scanning electron microscope SEM5000
What is nano-alumina? Nano-alumina has the characteristics of high strength, high hardness, good wear resistance, good heat resistance, and large specific surface area, and is… Read More »Application of Field Emission Scanning Electron Microscope SEM5000 in Nano-alumina
With the continuous development of science and technology, direct observation of atoms has always been the desire of people, and the emergence of electron microscopy… Read More »Exploring the Structure of Matter with Transmission Electron Microscopy
Guide Important equipment for microanalysis techniques include: Optical Microscope (OM), Dual Beam Scanning Electron Microscope (DB-FIB), Scanning Electron Microscope (SEM), and Transmission Electron Microscope (TEM).… Read More »Dual Beam Focused Ion Beam/Scanning Electron Microscope (DB-FIB) – Failure Analysis
A scanning electron microscope (SEM) is a very useful large-scale electron microscopic imaging system for failure analysis. How Scanning Electron Microscopes Work The working principle… Read More »Failure Analysis Using Scanning Electron Microscopy (SEM)